The Materials Characterization lab offers thermal, optical, microscopic, electrical and magnetic characterization of materials and elemental analysis of surfaces via a wide range of instruments including spectrophotometers, optical and electron microscopes, a SQUID magnetometer, and an X-Ray Photoelectron Spectrometer among many other characterization tools. The facility is located in Young Hall, rooms: 1033, 1041 and 1043. Members of the UCLA community, other academic institutions, and commercial enterprises may use our instrumentation after training.

All users will have their grants recharged for use of the NMR spectrometers. Users from Departments other than Chemistry and Biochemistry must request a 6-digit recharge account prior to use of the instrumentation (download application form).

To learn more, please contact Ignacio Martini:


  • XPS with UPS and SAM MPMS3 with AC, Oven and Ultra Low fields (DC and VSM measurement modes)

  • Zeiss Optical Microscope (reflectance optics, CCD camera)

  • Scanning Electron Microscope (SEM) with EDS

  • GPC with UV, MALS and dRI detectors

  • Spin Coater

  • TGA

  • DSC

  • Contact Angle Goniometer

  • Fluorimeter with integrating sphere (for quantum yield) and time-resolved capabilities

  • Dynamic Light Scattering

  • Sputterer (Au, Al, Pt)

  • UV/Vis/NIR Spectrometer (transmission, specular reflectance)

  • FTIR Spectrometer and Microscope with ATR capabilities


  • Polarimeter

  • Tube Furnaces with multi-step temperature controllers.

  • Small instruments: Vacuum Oven, Centrifuge, Balances, Multimeters, Keithley Source Meter, LCR meter (conductivity/capacitance/impedance of devices and films), Potentiostat / Galvanostat (cyclic voltammetry, anodic stripping voltametry, etc.), Sonicator bath, Probe sonicator, Ocean Optics Fluorimeter, MiniMatcher Color Viewing System, UV Ozone cleaner, Shaker.

Materials instruments