The Materials Characterization lab offers thermal, optical, microscopic, electrical and magnetic characterization of materials and elemental analysis of surfaces via a wide range of instruments including spectrophotometers, optical and electron microscopes, a SQUID magnetometer, and an X-Ray Photoelectron Spectrometer among many other characterization tools. The facility is located in Young Hall, rooms: 1033, 1041 and 1043. Members of the UCLA community, other academic institutions, and commercial enterprises may use our instrumentation after training.
XPS with UPS and SAM MPMS3 with AC, Oven and Ultra Low fields (DC and VSM measurement modes)
Zeiss Optical Microscope (reflectance optics, CCD camera)
Scanning Electron Microscope (SEM) with EDS
GPC with UV, MALS and dRI detectors
Contact Angle Goniometer
Fluorimeter with integrating sphere (for quantum yield) and time-resolved capabilities
Dynamic Light Scattering
Sputterer (Au, Al, Pt)
UV/Vis/NIR Spectrometer (transmission, specular reflectance)
FTIR Spectrometer and Microscope with ATR capabilities
Tube Furnaces with multi-step temperature controllers.
Small instruments: Vacuum Oven, Centrifuge, Balances, Multimeters, Keithley Source Meter, LCR meter (conductivity/capacitance/impedance of devices and films), Potentiostat / Galvanostat (cyclic voltammetry, anodic stripping voltametry, etc.), Sonicator bath, Probe sonicator, Ocean Optics Fluorimeter, MiniMatcher Color Viewing System, UV Ozone cleaner, Shaker.