The Materials Characterization lab offers thermal, optical, microscopic, electrical and magnetic characterization of materials and elemental analysis of surfaces via a wide range of instruments including light scattering spectrometers, several spectrophotometers; scanning probe microscopes, a SQUID magnetometer, a Scanning Electron Microscope, and an X-Ray Photoelectron Spectrometer among many other characterization tools.
The current rate is $30/month/user. Access fees are only charged to a maximum of 5 users per Research Director. This charge is assessed whether or not you use the lab. To avoid charges, please, notify us if you no longer plan to use the lab. Please make sure that your research director is aware of this charge policy.
Additionally, usage of some of the instruments in the Materials lab will be recharged based on the amount of time they are used. The current rates for the recharged instruments are:
Light Scattering $5/hour
XPS with UPS and SAM MPMS3 with AC, Oven and Ultra Low fields (DC and VSM measurement modes)
Zeiss Optical Microscope (reflectance optics, CCD camera)
Scanning Electron Microscope (SEM) with EDS
GPC with UV, MALS and dRI detectors
Contact Angle Goniometer
Static Light Scattering
Dynamic Light Scattering
Sputterer (Au, Al, Pt)
UV/Vis/NIR Spectrometer (transmission, specular reflectance)
Tube Furnaces with multi-step temperature controllers.
Small instruments: Vacuum Oven, Centrifuge, Balances, Multimeters, Keithley Source Meter, LCR meter (conductivity/capacitance/impedance of devices and films), Potentiostat / Galvanostat (cyclic voltammetry, anodic stripping voltametry, etc.), Sonicator bath, Probe sonicator, Ocean Optics Fluorimeter, MiniMatcher Color Viewing System, UV Ozone cleaner, Shaker.